Angular distribution of sputtered atoms induced by low-energy heavy ion bombardment
- 期刊名字:核技术(英文版)
- 文件大小:
- 论文作者:Zhang Lai,ZHANG Zhu-lin
- 作者单位:Department of Computer Science and Technology,Department of Mathematics and Physics
- 更新时间:2022-11-29
- 下载次数:次
论文简介
The sputtering yield angular distributions have been calculated based on the ion energy dependence of total sputtering yields for Ni and Motargets bombarded by low-energy Hg+ ion. The calculated curves show excellent agreement with the corresponding Wehner's experimental results of sputtering yield angular distribution. The fact clearly demonstrated the intrinsic relation between the ion energy dependence of total sputtering yields and the sputtering yield angular distribution. This intrinsic relation had been ignored in Yamamura's papers (1981,1982) due to some obvious mistakes.
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