3D Surface Morphology Measurement and Auto-focusing System 3D Surface Morphology Measurement and Auto-focusing System

3D Surface Morphology Measurement and Auto-focusing System

  • 期刊名字:半导体光子学与技术(英文版)
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  • 论文作者:CHEN Qi,ZANG Huai-pei
  • 作者单位:College of Inform.
  • 更新时间:2022-11-24
  • 下载次数:
论文简介

When interference microscope measures the surface rough of the micromechanical device, as soon as the work distance of interference microscope and the depth of field is shortened, the interference images become slur for the measured object if there has small interference after clear focus. The auto-focusing system is introduced into the interference microscope, the system can obtain high definition interference image rapidly,and can improve the measuring velocity and measuring precision. The system is characterized by auto-focusing range of ±150 μm, auto-focusing precision of ±0.3 μm, auto-focusing time of 4~8 s.

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