A Study on Measurement Error during Alternating Current Induced Voltage Tests on Large Transformers A Study on Measurement Error during Alternating Current Induced Voltage Tests on Large Transformers

A Study on Measurement Error during Alternating Current Induced Voltage Tests on Large Transformers

  • 期刊名字:国际设备工程与管理(英文版)
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  • 论文作者:WANG Xuan,LI Yun-ge,CAO Xiao-l
  • 作者单位:State Key Laboratory of Electrical Insulation for Power Equipment,High Voltage Department,Northwest China Grid Company L
  • 更新时间:2022-11-24
  • 下载次数:
论文简介

The large transformer is pivotal equipment in an electric power supply system; Its partial discharge test and the induced voltage withstand test on large transformers are carried out at a frequency about twice the working frequency. If the magnetizing inductance cannot compensate for the stray capacitance, the test sample turns into a capacitive load and a capacitive rise exhibits in the testing circuit. For self-restoring insulation, a method has been recommended in IEC60-1 that an unapproved measuring system be calibrated by an approved system at a voltage not less than 50% of the rated testing voltage, and the result then be extrapolated linearly. It has been found that this method leads to great error due to the capacitive rise if it is not correctly used during a withstand voltage test under certain testing conditions, especially for a test on high voltage transformers with large capacity. Since the withstand voltage test is the most important means to examine the operation reliability of a transformer, and it can be destructive to the insulation, a precise measurement must be guaranteed. In this paper a factor, named as the capacitive rise factor, is introduced to assess the rise. The voltage measurement error during the calibration is determined by the parameters of the test sample and the testing facilities, as well as the measuring point. Based on theoretical analysis in this paper, a novel method is suggested and demonstrated to estimate the error by using the capacitive rise factor and other known parameters of the testing circuit.

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