Specification and Measurement of Mid-Frequency Wavefront Errors

Mid-frequency wavefront errors can be of the most importance for some optical components, but they're not explicitly covered by corresponding international standards such as ISO 10110. The testing methods for the errors also have a lot of aspects to be improved. This paper gives an overview of the specifications especially of PSD. NIF,developed by America, and XMM, developed by Europe, have both discovered some new testing methods.