MEASUREMENT-BASED ADMISSION CONTROL USING MULTIPLE TIME-SCALES TEST
- 期刊名字:电子科学学刊(英文版)
- 文件大小:
- 论文作者:YI Na,Jiang Wei,Jin Ye,Liang Q
- 作者单位:Department of Electronics
- 更新时间:2022-11-24
- 下载次数:次
论文简介
A new measurement-based admission control algorithm to support Quality of Service(QoS) demand is proposed for soft real-time applications. In the algorithm, admission test is performed across Multiple Time-Scales (MTS) to accurately capture traffic fluctuation on various time-scales. By applying the QoS requirements directly to admission test, the MTS algorithm can properly meet the QoS target and maximize the bandwidth utilization.
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