Simulation and Analysis of Raw Silk Defects Simulation and Analysis of Raw Silk Defects

Simulation and Analysis of Raw Silk Defects

  • 期刊名字:东华大学学报(英文版)
  • 文件大小:
  • 论文作者:SHI Jia-li,ZHOU Guo-li,FAN Ron
  • 作者单位:Jiangsu Key Laboratory of Silk Engineering
  • 更新时间:2022-10-14
  • 下载次数:
论文简介

To test the reliability and stability of the inspecting program of the electronic inspection system for raw silk, a simulating program is developed to simulate various defect cases with the software tool of Laboratory Virtual Instrument Engineering Workbench ( Lab VIEW). Many techniques, such as random numbers, shift registers, for loop, case structures and waveforms, are used to facilitate the simulation. The simulated defects are inspected by the inspecting program successfully, which proves the effectiveness of the simulating program.

论文截图
版权:如无特殊注明,文章转载自网络,侵权请联系cnmhg168#163.com删除!文件均为网友上传,仅供研究和学习使用,务必24小时内删除。