Measurement of inter-particle forces by an interfacial force microscope Measurement of inter-particle forces by an interfacial force microscope

Measurement of inter-particle forces by an interfacial force microscope

  • 期刊名字:颗粒学报(英文版)
  • 文件大小:
  • 论文作者:Qing Huang,Asghar Mesbah-Nejad
  • 作者单位:Particle Technology Research Centre,Department of Electrical and Computer Engineering,Department of Chemistry
  • 更新时间:2022-11-24
  • 下载次数:
论文简介

An inteffacial force microscope (IFM) was employed to measure the inter-particle forces between two individual glass beads with diameters varying from 8 to 20 μm. With the feedback function of IFM turned off, attractive forces were obtained. The forces varied in the range of 0.1-0.34 μN, and their validity was confirmed by a theoretical analysis of the van der Waals force between the same glass beads. With the feedback function switched on, no attractive forces between particles were detected by the IFM when the probe approached the sample substrate. This may be attributed to the dramatic change of the attractive forces within a very short separation distance and/or the relatively poor signal-to-noise ratio of the IFM.

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