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Atomic Force Microscopy Studies on the Chemical Treatment of Nanocrystalline Porous TiO2 Films Atomic Force Microscopy Studies on the Chemical Treatment of Nanocrystalline Porous TiO2 Films

Atomic Force Microscopy Studies on the Chemical Treatment of Nanocrystalline Porous TiO2 Films

  • 期刊名字：中国化学快报
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  • 论文作者：Yuan LIN，Feng Zhi JIANG，Jing B
  • 作者单位：Center for Molecular Science,E-mail:
  • 更新时间：2022-12-26
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论文简介

AFM has been utilized to study the surface topography and the local conductivity of nanocrystalline TiO2 films. Improving the local conductivity by Ti(iso-C3H7O)4 treatment is characterized by quantitative analysis of the simultaneous current image. The mechanism of Ti(iso C3H7O)4 treatment is discussed.

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