Design and test results of a low-noise readout integrated circuit for high-energy particle detectors Design and test results of a low-noise readout integrated circuit for high-energy particle detectors

Design and test results of a low-noise readout integrated circuit for high-energy particle detectors

  • 期刊名字:核技术(英文版)
  • 文件大小:
  • 论文作者:ZHANG Mingming,CHEN Zhongjian,
  • 作者单位:Key Laboratory of Microelectrnic Devices and Circuits
  • 更新时间:2022-11-29
  • 下载次数:
论文简介

A low-noise readout integrated circuit for high-energy particle detector is presented. The noise of charge sensitive amplifier was suppressed by using single-side amplifier and resistors as source degeneration.Continuous-time semi-Gaussian filter is chosen to avoid switch noise. The peaking time of pulse shaper and the gain can be programmed to satisfy multi-application. The readout integrated circuit has been designed and fabricated using a 0.35 μm double-poly triple-metal CMOS technology. Test results show the functions of the readout integrated circuit are correct. The equivalent noise charge with no detector connected is 500-700 e in the typical mode, the gain is tunable within 13-130 mV/fC and the peaking time varies from 0.7 to 1.6 μs, in which the average gain is about 20.5 mV/fC, and the linearity reaches 99.2%.

论文截图
版权:如无特殊注明,文章转载自网络,侵权请联系cnmhg168#163.com删除!文件均为网友上传,仅供研究和学习使用,务必24小时内删除。