Electrochemical behaviors of silicon wafers in silica slurry Electrochemical behaviors of silicon wafers in silica slurry

Electrochemical behaviors of silicon wafers in silica slurry

  • 期刊名字:北京科技大学学报(英文版)
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  • 论文作者:Xiaolan Song,Haiping Yang,Xund
  • 作者单位:Department of Inorganic Materials,Silicon Wafer Manufacture Department
  • 更新时间:2022-11-14
  • 下载次数:
论文简介

The electrochemical behaviors of n-type silicon wafers in silica-based slurry were investigated, and the influences of the pH value and solid content of the slurry on the corrosion of silicon wafers were studied by using electrochemical DC polarization and AC impedance techniques. The results revealed that these factors affected the corrosion behaviors of silicon wafers to different degrees and had their suitable parameters that made the maximum corrosion rate of the wafers. The corrosion potential of (100) surface was lower than that of (111), whereas the current density of (100) was much higher than that of (111).

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