ANALYSIS OF NANOBRIDGE TESTS

This paper analyzes nanobridge tests with consideration of adhesive contact deformation, which occurs between a probe tip and a tested nanobeam, and deformation of a substrate or template that supports the tested nanobeam. Analytical displacement-load relation, including adhesive contact deformation and substrate deformation, is presented here for small deformation of bending. The analytic results are confirmed by finite element analysis. If adhesive contact deformation and substrate deformation are not considered in the analysis of nanobridge test data, they might lead to lower values of Young's modulus of tested nanobeams.