Theoretical Analysis and Simulation of BJFET Obstructive Characteristics Theoretical Analysis and Simulation of BJFET Obstructive Characteristics

Theoretical Analysis and Simulation of BJFET Obstructive Characteristics

  • 期刊名字:半导体光子学与技术
  • 文件大小:
  • 论文作者:ZENG Yun,YAN Min,Yan Yong-hong
  • 作者单位:Microelectronic institute
  • 更新时间:2022-11-03
  • 下载次数:
论文简介

A new bipolar junction field-effect transistor (BJFET) was described. The theoretical analysis and computer simulation of BJFET obstructive characteristic are achieved. The gate bias voltage affects the BJFET obstructive voltage greatly. The BJFET obstructive characteristic is relevant to structure parameters of channel width W and channel length L.The decrease-bias-voltage operation can weaken the device obstructive characteristic. The forward turn in device forward obstructive region can also affect the BJFET obstructive characteristic. BJFET has a good high temperature obstructive characteristic and can be applying to high temperature status as high voltage switch devices.

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