IEC 62899-503-3-2021Printed electronics - Part 503-3- Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method IEC 62899-503-3-2021Printed electronics - Part 503-3- Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method

IEC 62899-503-3-2021Printed electronics - Part 503-3- Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method

  • 标准类别:[IEC] 国际电工委员会标准
  • 标准大小:
  • 标准编号:IEC 62899-503-3-2021
  • 标准状态:
  • 更新时间:2022-04-04
  • 下载次数:
标准简介

IEC 62899-503-3-2021Printed electronics - Part 503-3- Quality assessment - Measuring method of contact resistance for the printed thin film transistor - Transfer length method

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