IEC 60749-5-2017 半导体设备--机械和气候试验方法--第5部分:稳定状态温度湿度偏重生命试验 Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
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- 标准大小:
- 标准编号:IEC 60749-5-2017
- 标准状态:现行
- 更新时间:2023-06-03
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标准简介
This part of IEC 60749 provides a steady-state temperature and humidity bias life test for the
purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid
environments.
This test method is considered destructive.dition 2.0 2017-04
INTERNATIONAL
STANDARD
Semiconductor devices – Mechanical and climatic test methods –
Part 5: Steady-state temperature humidity bias life test
IEC 60749-5:2017-04(en)
THIS PUBLICATION IS COPYRIGHT PROTECTED
Copyright ? 2017 IEC, Geneva, Switzerland
All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form
or by any mean
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