首页 > 标准下载>ASTM E2446-2015 计算机X光系统分类规程 Standard Practice For Manufacturing Characterization Of Computed Radiography Systems免费下载
ASTM E2446-2015 计算机X光系统分类规程 Standard Practice For Manufacturing Characterization Of Computed Radiography Systems ASTM E2446-2015 计算机X光系统分类规程 Standard Practice For Manufacturing Characterization Of Computed Radiography Systems

ASTM E2446-2015 计算机X光系统分类规程 Standard Practice For Manufacturing Characterization Of Computed Radiography Systems

  • 标准类别:
  • 标准大小:
  • 标准编号:ASTM E2446-2015
  • 标准状态:现行
  • 更新时间:2023-08-27
  • 下载次数:
标准简介

1.1 This practice describes the manufacturing characterization of computed radiography (CR) systems, consisting of a particular phosphor imaging plate (IP), scanner, software, and an image display monitor, in combination with specified metal screens for industrial radiography. 1.2 The practice defines system tests to be used to characterize the systems of different suppliers and make them comparable for users. 1.3 This practice is intended for use by manufacturers of CR systems or certification agencies to provide quantitative results of CR system characteristics for nondestructive testing (NDT) user or purchaser consumption. Some of these tests require specialized test phantoms to ensure consistency of results among suppliers or manufacturers. These tests are not intended for users to complete, nor are they intended for long term stability tracking and lifetime measurements. However, they may be used for this purpose, if so desired. 1.4 The CR system performance is described by the basic spatial resolution, contrast, signal and noise parameters, and the equivalent penetrameter sensitivity (EPS). Some of these parameters are used to compare with DDA characterization and film characterization data (see Practice E2597 and Test Method E1815). Note 1: For film system characterization, the signal is represented by the optical density of 2 (above fog and base) and the noise as granularity. The signal-to-noise ratio is normalized by the aperture (similar to the basic spatial resolution) of the system and is part of characterization. This normalization is given by the scanning circular aperture of 100 µm of the micro-photometer, which is defined in Test Method E1815 for film system characterization. 1.5 The measurement of CR systems in this practice is restricted to a selected radiation quality to simplify the procedure. The properties of CR systems will change with radiation energy but not the ranking of CR system perfo

标准截图
下一条:返回列表
版权:如无特殊注明,文章转载自网络,侵权请联系cnmhg168#163.com删除!文件均为网友上传,仅供研究和学习使用,务必24小时内删除。