首页 > 标准下载>NF C96-022-30-2020 Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing免费下载
NF C96-022-30-2020 Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing NF C96-022-30-2020 Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing

NF C96-022-30-2020 Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing

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  • 标准编号：NF C96-022-30-2020
  • 标准状态：现行
  • 更新时间：2023-11-16
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