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NF C96-022-44-2016   Semiconductor devices - Mechanical and climatic test methods - Part 44 - neutron beam irradiated single event effect (SEE) test method for semiconductor devices NF C96-022-44-2016   Semiconductor devices - Mechanical and climatic test methods - Part 44 - neutron beam irradiated single event effect (SEE) test method for semiconductor devices

NF C96-022-44-2016 Semiconductor devices - Mechanical and climatic test methods - Part 44 - neutron beam irradiated single event effect (SEE) test method for semiconductor devices

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  • 标准编号:NF C96-022-44-2016
  • 标准状态:现行
  • 更新时间:2023-11-22
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